Quasi-Random Errors Model

The Quasi-Random Errors mode of the program combines the features of the Systematic Errors and Random Errors modes. It incorporates the sophisticated mathematical algorithm based on the most advanced ideas of the theory of inverse problems (so-called ideas of the regularization of the inverse problem solution).

Quasi-Random Errors mode allows you to take into account a priori information about levels of errors in layer thicknesses.

Example: reverse engineering of broadband anti-reflection coating produced with the help of very accurate time monitoring. See the details in our publications.

 

post-production characterization

Absolute errors in layer thicknesses estimated using Quasi Random algorithm with a priori information about smallness of the errors.

optical characterization

Initial fitting of multiscan in-situ transmittance data by theoretical transmittance of 10-layer anti-reflection coating.

optical characterization

Final fitting of multiscan in-situ transmittance data by model transmittance.

Application of this mode to reverse engineering problems has been demonstrated in our publications:

  1. T. Amotchkina, M. Trubetskov, V. Pervak, and A. Tikhonravov. “Design, production and reverse engineering of two-octave antireflection coatings.” Appl. Opt. 50, 6468-6475 (2011).
  2. T.V. Amotchkina, M.K. Trubetskov, A.V. Tikhonravov, V. Pervak,  “Reverse engineering of an output coupler using broadband monitoring data and group delay measurements,” in Optical Interference Coatings, OSA Technical Digest (Optical Society of America, 2013), paper WB.2.

Look our video examples

Look our video examples at YouTube

OptiLayer videos are available here:
Overview of Design/Analysis options of OptiLayer and overview of Characterization/Reverse Engineering options.

The videos were presented at the joint Agilent/OptiLayer webinar.