OptiLayer

  • Specifications for the conventional targets implemented in OptiLayer. History and collection shows additionally the percentage of formally fulfilled specification requirements. Specifications are displayed in the evaluation windows by shadowed areas. Violated points at the boundaries are colored in red. Specification quality (the percentage of good spectral point with respect to the total number of points) is included in all related reports. Generator added to Specification Editor.
  • Redesigned Database dialog (and preserving old style). Expert and Simple modes of the user interface. Database visibility can be additionally fine-tuned in the General Configuration dialog. Advanced features (Scientific mode) now is more easily accessible (with a disclaimer) through General Configuration dialog (Mode tab).
  • Computations of Cone angles and Stacks were redesigned and significantly accelerated. A number of computational problems have been fixed.
  • Peak list command added to right-click menus of evaluation windows. It allows to see and to copy to the clipboard the list of minima and maxima of all displayed spectral characteristics. Peak extractor has been added to the right-click menu of the Target Editor. It allows to see all maxima and minima of the specified target.
  • Implemented Stack option and multi-Environment mode. It works with Conventional, Integral, Color targets, with Cone angle objects and Line Width. Layer Absorptance targets and EFI Targets are not working with Stacks since these targets are heavily dependent on internal arrangement of layers in a design, and for multiple designs in a stack the meaning of these targets is not clear.
  • Implemented Wavefront/Taper analysis option in order to estimate the influence of inhomogeneities of the deposition on the spectral characteristics and on the wavefront of the reflected or transmitted wave. Phase computations include total path of the beam including extra space in the incident medium due to changed total thickness of the coating at different positions.
  • Color Target improvements: in some cases range targets were not displayed at preview tabs.
  • Implemented the display of ranges in different color coordinates when L* value is also specified. We assume that this L* value is valid for all vertices of the range specification and perform the transformation to/from all possible color coordinates.
  • New smart adaptive strategy of dynamic control of computation accuracy and termination criteria implemented. The main goal is to reduce the total computational time without sacrificing the quality of the results.
  • In the Silent mode the plots are now updated for each 30 seconds. Otherwise the look of the main computational window is a bit misleading.
  • The output of materials now always includes interpolated values of Re(n) or Im(n) even if they were specified by formulas.
  • Reports improvement: for better readability comments are indented to the right by 9 blanks.
  • Current Stack Report is shown in the Report menu when a stack is loaded to memory. It removes possible misunderstanding on the purpose of this menu command.
  • Improved display of constant plots, especially in layer material and substrate windows.
  • Variator is now always using Reference wavelength specified in the General Configuration dialog. Small visual quirks fixed.
  • Random Optimization Setup dialog – ability to select between Physical and Optical thicknesses inside this dialog, using right-click menu.
  • Bugs related to slider controls in Rugate synthesis mode fixed.
  • More informative hints explaining different marks at the Color Evaluation windows: now the angle if incidence and the name of the related object are displayed.
  • Color Evaluation bug fixed: even if design display was not selected, the marks related to the current design colors appeared after changing tabs of the color diagrams.
  • Save Project – Open Project commands. The list of project files can now be sorted with respect to any column in the Details view mode.
  • Implemented import of Tin Model files describing inhomogeneities of the deposition in a chamber. During import OptiLayer tries to select several environments with different Taper coefficient in order to optimize the overall production quality for multiple samples.
  • Pulse analysis option has been implemented. This option allows to analyze ultrafast laser pulses and their interaction with dispersive mirrors.
  • Multi-coating synthesis has been implemented. Learn more…

 

 OptiChar

  • “Combine…” command was implemented in the Measurements database. It allows to combine on-page multiple measurements to a single file. Types of measurement characteristics and angles of incidence can be adjusted. Source files can be deleted after combining if a corresponding option is selected at the bottom of the dialog.
  • Improved management of substrate characterization and layer characterization procedures, when they are used in the same Problem Directory. OptiChar now will propose to save Substrate Characterization model before any Layer Characterization commands are used. It makes the whole data processing work flow more consistent.
  • Redesigned Database dialog (and preserving old style). Expert and Simple modes of the user interface. Database visibility can be additionally fine-tuned in the General Configuration dialog. Advanced features (Scientific mode) now is more easily accessible (with a disclaimer) through General Configuration dialog (Mode tab).
  • Output of materials now always include interpolated values of Re(n) or Im(n) even if they were specified by formulas.
  • Reports improvement: for better readability comments are indented to the right by 9 blanks.
  • Improved display of constant plots, especially in layer material and substrate windows.
  • Color Target improvements: in some cases range targets were not displayed at preview tabs.
  • In the fitting and discrepancy windows the theoretical curve is now always plotted after all measurements (even appended ones).
  • More informative hints explaining different marks at the Color Evaluation windows: now the angle if incidence and the name of the related object are displayed.
  • Peak Extractor added to the right-click menu of the Fitting window and Measurements Editor. It allows to see all maxima and minima of the measurements and the model.
  • Save Project – Open Project commands. The list of project files can now be sorted with respect to any column in the Details view mode.

 

OptiRE

  • Sellmeier 3 model added to Refractive Index models. Due to high nonlinearity of this formula OptiRE requires a Sellmeier 3 material to be loaded under the same abbreviation as used for this model. The coefficient of the loaded material are used as starting approximation during RE procedure.
  • “Combine…” command was implemented into the Measurements database. It allows to combine multiple measurements to a single file. Types of measurement characteristics and angles of incidence can be adjusted. Source files can be deleted after combining if a corresponding option is selected at the bottom of the dialog.
  • Color patch – more natural color reproduced implemented.
  • Python examples added to COM Automation examples.
  • Peak Extractor added to the right-click menu of the Fitting window and Measurements Editor. It allows to see all maxima and minima of the measurements and the model.
  • Redesigned Database dialog (and preserving old style). Expert and Simple modes of the user interface. Database visibility can be additionally fine-tuned in the General Configuration dialog. Advanced features (Scientific mode) now is more easily accessible (with a disclaimer) through General Configuration dialog (Mode tab).
  • Output of materials now always include interpolated values of Re(n) or Im(n) even if they were specified by formulas.
  • Reports improvement: for better readability comments are indented by 9 blanks to the right.
  • Fixed bugs in the indirect monitoring mode and complicated arrangements of measurement data.
  • Specifications added to OptiRE. If a specification file is loaded, the results are shown in the RE Spectra window. The quality (the ratio of good spectral points for the current model to the total number of spectral points in the specification) is show in the status bar and is included in all related reports.
  • Added independent control of substrate back side effect in the evaluation of RE Spectra. It is useful in the situations when measurements and reverse engineering is performed with the effect of the back side, while theoretical characteristics and specifications are considered in the ideal case, for the case of semi-infinite substrate.
  • Improved display of constant plots, especially in layer material and substrate windows.
  • Color Target improvements: in some cases range targets were not displayed at preview tabs.
  • In the fitting and discrepancy windows the theoretical curve is now always plotted after all measurements (even appended ones).
  • Generator added to Specification Editor.
  • Bugs related to slider controls in n(lambda) and k(lambda) RE modes fixed.
  • More informative hints explaining different marks at the Color Evaluation windows: now the angle if incidence and the name of the related object are displayed.
  • Ref. wavelength is now used in the Variator instead of Design Control wavelength. It makes studies of the refractive index variations more convenient, since Ref. wavelength can be changed without affection the design and the model.
  • Integral of measurement is trying to adjust configuration of displayed values to a new measurement file, and do not delete values display like it was before.
  • Color Evaluation bug fixed: even if the model display was not selected, the marks related to the current RE model colors appeared after changing tabs of the color diagrams.
  • Termination of long running computations in Silent mode now do not revert to the initial model, but load the last obtained model parameters.
  • Added commands to save and to restore any formatting of Integrals, Values window in General Configuration. It is useful for cross-project maintenance of the formatting style of this window.
  • Save Project – Open Project commands. The list of project files can now be sorted with respect to any column in the Details view mode.